TR5001V SII SERIES
- 產(chǎn)品名稱：TR5001V SII SERIES
- 產(chǎn)品型號(hào)：TR5001V SII SERIES
- 產(chǎn)品廠商：TRI
- 產(chǎn)品文檔：
TR5001V SII SERIES
的詳細(xì)介紹
FEATURES：
? Reliable Vacuum Fixture Testing
? Non-Multiplexing 1:1 per Pin
Architecture
? Scalable MDA to ICT and
Functional Test
? High Accuracy and High
Throughput
? Durable Quick Disconnection
Interface
? 新一代高彈性多核心平行測試
? 先進(jìn)串列測試功能多達(dá)8個(gè)獨(dú)立的連接埠可量測任一腳位
? 有限接入解決方案，并使用PXI模組功能測試擴(kuò)張
? 內(nèi)建自我診斷系統(tǒng)及支援自動(dòng)校驗(yàn)功能
? 高精準(zhǔn)度量測與測試
? 直覺化與流程化簡易編程使用介面
Tester Specifications
|
Analog/hybrid test points |
TR5001QV SII: 4096 |
|
Operating System |
Microsoft® Windows compatible PC with USB, Windows 10 |
|
Fixture Type |
Vacuum fixture with Quick Disconnection InterfaceStandard Testing Components |
|
Analog Test Hardware |
· 6-wire measurement switching matrix · Programmable AC/DC/DC High voltage and current sources · AC/DC voltage, DC current measurement · Component R/L/C measurement |
Optional Components
|
Analog Hardware |
· TestJet vectorless open circuit detection · Arbitrary Waveform Generator |
|
Digital Testing |
· Non-multiplexing 1:1 per pin architecture with independent per-pin level setting · DUT power supplies: 5 V@3 A, 3.3 V@3 A, 12 V@3A, -12 V@1 A and 24 V@3 A · Programmable DUT power supplies: 75 V / 8 A max, 200W maximum output power · Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test · Up to 8 High Speed Serial Ports, On-board Flash, EEPROM, MAC programming |
|
Yield Management System |
YMS 4.0 |
Dimensions
|
WxDxH |
900 x 1080 x 1270 mm |
|
Weight |
TR5001QV SII: 370 kg |